The TIPP guideline—a set of four documents developed by the GS1 US's Item Level RFID Workgroup—is intended to make it easier for both retailers and suppliers to test and identify the best tag for use with each product and use case. That, predicts Melanie Nuce, GS1 US vice president of apparel and general merchandise, could pave the way for more universal adoption of item-level RFID tagging of apparel and other goods.
The series consists of the following four documents. TIPP Tagged-Item Grading: Overview provides an overview of the tagged-item grading guideline. TIPP Tagged-Item Grading: Grade Definitions defines the eight total grade specifications. TIPP Tagged-Item Grading: Testing Methodology presents the test procedure and measurement methods to qualify or establish the grade for a tagged item. And TIPP Tagged-Item Grading Testing Configurations defines the orientation for various types of tagged items (which is critical for repeatable testing using the TIPP procedure).
